MTSI 552 - Advanced Materials Characterization Techniques II

3 credits (Hrs: 3 Lec)

A two-semester laboratory-based survey providing experience with the common qualitative and quantitative characterization and analytical tools used in materials science and engineering. Techniques include scattering, diffraction, microscopy (optical, electron, tunneling, etc.), optical, thermal, mass spectrometry, NMR, and other techniques. An important emphasis of this course sequence will be teaching students how to select the characterization/analysis tools appropriate to the research project, use the instruments effectively, and analyze and evaluate the data that result from the different types of measurements. Relevant data from actual materials systems (acquired from instrumentation at any one of the three campuses) will serve as the platform for discussing the basis (theory) of the instrument and assessing instrumental capabilities and limitations. Specific instrumentation and methods featured each semester are selected to complement the topics in Advanced Materials Science I/II.